Detailed Project Report · Custom Memory · 2025–2026

512-bit SRAM Macro with Four-Way Bank Interleaving

Qinyan Zeng
Department of Electrical and Computer Engineering
University of Southern California · qyzeng.work@gmail.com

Abstract

This project develops a complete SRAM macro rather than an isolated bitcell. The design combines a four-way bank-interleaved array with row and column decoding, write drivers, sense amplifiers, output latches, and registers. Verification progresses from a single-bitcell testbench to the full array.

Keywords—Cadence Virtuoso, SRAM, DRC, LVS, PEX, Timing simulation.

I. Project summary

Capacity512 bit
Word size16 bit
OrganizationFour-way bank interleaving
Reported maximum frequency500 MHz

II. Scope and contribution

  • Designed the bitcell array organization and bank interleaving.
  • Implemented row/column decoders, write drivers, sensing, latch, and output register circuitry.
  • Built bitcell and full-array testbenches.

III. Methodology

  1. Bitcell-first verification
  2. Bank-interleaved organization
  3. Peripheral-circuit integration
  4. Full-array timing simulation

IV. Verification

  • Single-bitcell functional testbench.
  • Full-array read/write testbench.
  • DRC, LVS, and PEX.
  • Functional and timing verification of the integrated macro.

V. Reported results

  • Completed the custom 512-bit SRAM macro and peripheral circuitry.
  • Verified operation at a reported maximum frequency of 500 MHz.

VI. Artifacts and data availability

The résumé establishes the following artifact classes. Public-safe figures and report excerpts will be attached after review:

  • Bitcell schematic/layout
  • Array floorplan
  • Peripheral schematics
  • Full-array waveforms
  • Timing summary